Pattern models . Ahuja Narendra; Schachter Bruce
Material type:
TextLanguage: English Publication details: New York John Wiley 1983Description: xiv309p cmDDC classification: - D651:915, M3
| Item type | Current library | Home library | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
Textual
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South Campus Library | South Campus Library | D651:915 M3 (Browse shelf(Opens below)) | Available | SC0850580 |
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| D651:915 M1 Pattern classifiers and trainable machines. | D651:915 M1 Image modeling. | D651:915 M2 Multicomputers and image processing. | D651:915 M3 Pattern models . | D651:915 M3 Image sequence processing and dynamic scene analysis. | D651:915 M3 Issues in acoustic signal-image processing and recognition. | D651:915 M4 Multiresolution image processing and analysis. |
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