Reifenberger Ronald G <br/><br/>
Fundamentals of Atomic Force Microscopy - Part I: Foundations 

 -  World Scientific  WSPC  2015 
<br/><br/><label>ISBN: </label>9789814630368 
<br/><br/><label>Source: </label>EBOOK 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology & Nanoscience