TY  - BOOK
AU  - Levinshtein Michael Et Al
TI  - Breakdown Phenomena in Semiconductors and Semiconductor Devices
SN  - 9789812703330
PB  - World Scientific
KW  - Engineering / Acoustics
UR  - https://www.worldscientific.com/worldscibooks/10.1142/5877#t=toc
ER  -