TY  - BOOK
AU  - Schrimpf R D & Fleetwood D M
TI  - Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices
SN  - 9789812794703
PB  - World Scientific
KW  - Engineering / Acoustics
UR  - https://www.worldscientific.com/worldscibooks/10.1142/5607#t=toc
ER  -