Andrej Rumiantsev  <br/><br/>
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond 

 -  Taylor and Francis  2019 
<br/><br/><label>ISBN: </label>9781003338994 
<br/><br/><label>Source: </label>EBOOK