TY  - BOOK
AU  -  Andrej Rumiantsev 
TI  - On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
SN  - 9781003338994
PB  - Taylor and Francis
UR  - http://www.taylorfrancis.com/books/9781003338994
ER  -