Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon <br/><br/>
Ferroelectric-Gate Field Effect Transistor Memories 

 -  Springer  Springer  2016 
<br/><br/><label>ISBN: </label>9789402408416 
<br/><br/><label>Source: </label>EBOOK