TY  - BOOK
AU  - Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis
TI  - VLSI-SoC: Design for Reliability, Security, and Low Power
SN  - 9783319460970
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-46097-0
ER  -