TY  - BOOK
AU  - S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
TI  - VLSI Design and Test
SN  - 9789811359507
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-981-13-5950-7
ER  -