Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr <br/><br/>
Long-Term Reliability of Nanometer VLSI Systems 

 -  Springer  Springer  2019 
<br/><br/><label>ISBN: </label>9783030261726 
<br/><br/><label>Source: </label>EBOOK