TY  - BOOK
AU  - Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr
TI  - Long-Term Reliability of Nanometer VLSI Systems
SN  - 9783030261726
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-030-26172-6
ER  -