TY  - BOOK
AU  - Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
TI  - Ferroelectric-Gate Field Effect Transistor Memories
SN  - 9789811512124
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-981-15-1212-4
ER  -