Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani <br/><br/>
Pattern Recognition. ICPR International Workshops and Challenges 

 -  Springer  Springer  2021 
<br/><br/><label>ISBN: </label>9783030687878 
<br/><br/><label>Source: </label>EBOOK