Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du <br/><br/>
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System 

 -  Springer  Springer  2022 
<br/><br/><label>ISBN: </label>9789811931321 
<br/><br/><label>Source: </label>EBOOK