TY  - BOOK
AU  - Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du
TI  - Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
SN  - 9789811931321
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-981-19-3132-1
ER  -