TY  - BOOK
AU  - Ambika Prasad Shah, Sudeb Dasgupta, Anand Darji, Jaynarayan Tudu
TI  - VLSI Design and Test
SN  - 9783031215148
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-031-21514-8
ER  -