00597nam a2200217Ia 450000500170000000800460001703700100006304000080007304000080008104000080008904100080009704100080010508400080011310000190012124500450014026000090018585600630019494200100025799900210026795200910028820260320201706.0008  262003s9999    xx            000 0 eng d  aEBOOK  aCRL  beng  cCRL  2eng  aeng  qCRL  aMains91135684 0aTopics in Modal Analysis & Testing, 2016  bIEEE  uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=11000396  cEBOOK  c1722956d1722956  00104070aCRLbCRLd2026-03-20l0pCL2127050r2026-03-20 20:17:06w2026-03-20yEBOOK