Alford Terry L <br/><br/>
Fundamentals of nanoscale film analysis 
by Alford Terry L; Feldman Leonard C; Mayer James W 
 - New York   Springer        2007 
 - xiv,336p.  cm. 
<br/><br/> Includes bibliographical references; Appendix 1-13 291-329p; Index 330-336p 
<br/><br/><label>ISBN: </label>9780387292601 (hbd) 
<br/><br/><label>Standard No.: </label>78816 
<br/><br/><label>Source: </label> 1994, 25/10/2007, The Book Seller  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Nanostructured material<br/> Thin film<br/>Physics
<br/><br/><label>Dewey Class. No.: </label>C21:(D), P7