TY  - BOOK
AU  - Bourgoin J
AU  -  Lannoo M
TI  - Point defects in semiconductors II
T2  - Springer series in solid-state sciences; 35
U1  - C6:212, M11 M3.2 
PY  - 1983///
CY  - Berlin
PB  - Springer-Verlag         
KW  - Semiconductors
ER  -