TY  - BOOK
AU  - Miller D M Ed.
TI  - Developments in integrated circuit testing
T2  - Perspective in computing; 18
U1  - D65,2, M7 
PY  - 1987///
CY  - London
PB  - Academic Press        
KW  -  Circuits
KW  -  Electronics
KW  - Engineering
ER  -