Garg Rajesh Analysis and design of resilient VLSI circuits Mitigating soft errors and process variations. Garg Rajesh; Khatri Sunil P - New York Springer 2010 - xx,212p cm. ISBN: 6634.6809999999996 Standard No.: 115115 Source: 128, 10/02/2012, Aviva Books Company Textual Subjects--Topical Terms: Electronic Science Dewey Class. No.: D651, Q0