TY  - BOOK
AU  - Garg Rajesh
AU  -  Khatri Sunil P
TI  - Analysis and design of resilient VLSI circuits : Mitigating soft errors and process variations
U1  - D651, Q0 
PY  - 2010///
CY  - New York  
PB  -  Springer      
KW  - Electronic Science
ER  -