Goodhew Peter J; Humphreys John; Beanland Richard <br/><br/>
Electron microscopy and analysis 
Goodhew Peter J; Humphreys John; Beanland Richard 
 - 3 
 - London  Taylor & Francis       2001 
 - xii,251p. ill. 
<br/><br/> Include bibliographical references.; Index 243-251p. 
<br/><br/><label>ISBN: </label>9780748409688 (pbk) SL01560225 
<br/><br/><label>Standard No.: </label>188748 
<br/><br/><label>Source: </label> 3188, 23/04/2013, Educational Book Agency (India)  Textbook 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Electron diffraction<br/> Electron microscopy<br/>Chemistry
<br/><br/><label>Dewey Class. No.: </label>E:(G:1996), P1-;4 TE