000			00572nam a2200157Ia 4500
005			20250508154944.0
008			008 250505s9999 xx 000 0 eng d
037			_aBooks to be hide in OPAC
040			_aFEDL _beng _cFEDL
041			_aeng _2eng
084			_a370.78, STA/O _qFEDL
245		0	_aSequential analysis when quality is measured by the number of defects per unit and when the question is whether a standard is exceeded
260			_aNew York, USA _b Columbia University Press _c1946
942			_cHB _h370.78, STA/O
999			_c1353113 _d1353113