000 00705nam a2200205Ia 4500
005 20260114155021.0
008 008 250103s9999 xx 000 0 eng d
037 _aTheses
040 _aCRL
_beng
_cCRL
041 _aeng
_2eng
084 _qCRL
100 _aSharma Monika Au.
_9869892
245 0 _aModeling Simulation and Reliability Analysis of Doping less TFET for Radiation Sensitive and Low Power Circuit Applications
260 _aDelhi
_bUniversity of Delhi. Faculty of Inter-Disciplinary&Applied Science. Deptt. of Elctronic Science
_c2023
300 _a142p.
650 _aElectronic Science
_9869893
700 _a Gupta Mridula Gu.
_9869894
942 _cTH
999 _c1469674
_d1469674