000 00565nam a2200217Ia 4500
005 20260115172732.0
008 008 260114s9999 xx 000 0 eng d
020 _a9781139505819
037 _aEBOOK
040 _aCRL
_beng
_cCRL
041 _aeng
_2eng
084 _qCRL
100 _aHo et al
_9878125
245 0 _aElectromigration in Metals
260 _bCambridge University Press
260 _bCambridge University Press
260 _c2022
856 _uhttps://doi.org/10.1017/9781139505819
942 _cEBOOK
999 _c1476730
_d1476730