000 00666nam a2200241Ia 4500
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008 6654 260114s9999 xx 000 0 eng d
020 _a9789814277112
037 _aEBOOK
040 _aCRL
_beng
_cCRL
041 _aeng
_2eng
084 _qCRL
100 _aJohnston Allan H
_9958931
245 0 _aReliability and Radiation Effects in Compound Semiconductors
260 _bWorld Scientific
260 _bWSPC
260 _c2010
650 _aEngineering / Acoustics
_9958932
856 _uhttps://www.worldscientific.com/worldscibooks/10.1142/7331#t=toc
942 _cEBOOK
999 _c1543954
_d1543954