| 000 | 00661nam a2200241Ia 4500 | ||
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| 005 | 20260121112613.0 | ||
| 008 | 7326 260114s9999 xx 000 0 eng d | ||
| 020 | _a9789812778826 | ||
| 037 | _aEBOOK | ||
| 040 |
_aCRL _beng _cCRL |
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| 041 |
_aeng _2eng |
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| 084 | _qCRL | ||
| 100 |
_aNakamura Takashi Et Al _9960275 |
||
| 245 | 0 | _aTerrestrial Neutron-Induced Soft Error in Advanced Memory Devices | |
| 260 | _bWorld Scientific | ||
| 260 | _bWSPC | ||
| 260 | _c2008 | ||
| 650 |
_aPhysics _9960276 |
||
| 856 | _uhttps://www.worldscientific.com/worldscibooks/10.1142/6661#t=toc | ||
| 942 | _cEBOOK | ||
| 999 |
_c1544626 _d1544626 |
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