000			00738nam a2200241Ia 4500
005			20260121112648.0
008			7793 260114s9999 xx 000 0 eng d
020			_a9789812773760
037			_aEBOOK
040			_aCRL _beng _cCRL
041			_aeng _2eng
084			_qCRL
100			_aWon Young Yun Et Al _9961209
245		0	_aAdvanced Reliability Modeling Ii: Reliability Testing and Improvement - Proceedings of the 2Nd International Workshop Aiwarm 2006
260			_bWorld Scientific
260			_bWSPC
260			_c2006
650			_aEngineering / Acoustics _9961210
856			_uhttps://www.worldscientific.com/worldscibooks/10.1142/6091#t=toc
942			_cEBOOK
999			_c1545093 _d1545093