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020 _a9789814439268
037 _aEBOOK
040 _aCRL
_beng
_cCRL
041 _aeng
_2eng
084 _qCRL
100 _aJakubowski A, Marciniak W & Przewlocki H
_9969412
245 0 _aDiagnostic Measurements in Lsi/Vlsi Integrated Circuits Production
260 _bWorld Scientific
260 _bWSPC
260 _c1991
650 _aEngineering / Acoustics
_9969413
856 _uhttps://www.worldscientific.com/worldscibooks/10.1142/1142#t=toc
942 _cEBOOK
999 _c1549195
_d1549195