| 000 | 00705nam a2200253Ia 4500 | ||
|---|---|---|---|
| 005 | 20260121155713.0 | ||
| 008 | 008 260114s9999 xx 000 0 eng d | ||
| 020 | _a9781003338994 | ||
| 037 | _aEBOOK | ||
| 040 | _aCRL | ||
| 040 | _beng | ||
| 040 | _cCRL | ||
| 041 | _2eng | ||
| 041 | _aeng | ||
| 084 | _qCRL | ||
| 100 |
_a Andrej Rumiantsev _91022793 |
||
| 245 | 0 | _aOn-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond | |
| 260 | _bTaylor and Francis | ||
| 260 | _c2019 | ||
| 856 | _uhttp://www.taylorfrancis.com/books/9781003338994 | ||
| 942 | _cEBOOK | ||
| 999 |
_c1589612 _d1589612 |
||