000 00717nam a2200265Ia 4500
005 20260121165203.0
008 008 260114s9999 xx 000 0 eng d
020 _a9789402408416
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aByung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
_91048586
245 0 _aFerroelectric-Gate Field Effect Transistor Memories
260 _bSpringer
260 _bSpringer
260 _c2016
856 _uhttps://link.springer.com/openurl?genre=book&isbn=978-94-024-0841-6
942 _cEBOOK
999 _c1614311
_d1614311