000 | 00920nam a2200337Ia 4500 | ||
---|---|---|---|
003 | OSt | ||
005 | 20220912144716.0 | ||
006 | a|||||r|||| 00| 0 | ||
007 | ta | ||
008 | 220909b |||||||| |||| 00| 0 eng d | ||
020 | _a9781107005938 (hbk) | ||
020 | _aSL01598379 | ||
024 | _a192708 | ||
037 | _b2939, 18/03/2015, Ashutosh Technical Books | ||
037 | _cTextbook | ||
040 |
_aCSL _beng _cCSL |
||
041 | _aeng | ||
082 | _aC6:212, Q4 TC | ||
100 | _aEngstrom Olof | ||
245 | 0 |
_cEngstrom Olof _aMos system |
|
260 |
_aUK _bCUP _c2014 |
||
300 | _a9, 355p. ill. | ||
500 | _aIndex 352-355p. | ||
650 | _a Carrier capture | ||
650 | _a Electrical characterization | ||
650 | _a Gate metals | ||
650 | _aElectron states | ||
700 | _aEngstrom Olof | ||
942 |
_hC6:212, Q4 TC _cTB _2CC |
||
999 |
_c16336 _d16336 |