000 00670nam a2200265Ia 4500
005 20260121173549.0
008 008 260114s9999 xx 000 0 eng d
020 _a9783031215148
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aAmbika Prasad Shah, Sudeb Dasgupta, Anand Darji, Jaynarayan Tudu
_91102424
245 0 _aVLSI Design and Test
260 _bSpringer
260 _bSpringer
260 _c2022
856 _uhttps://link.springer.com/openurl?genre=book&isbn=978-3-031-21514-8
942 _cEBOOK
999 _c1668169
_d1668169