| 000 | 00995nam a2200325Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912145158.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9780387292601 (hbd) | ||
| 024 | _a78816 | ||
| 037 | _b1994, 25/10/2007, The Book Seller | ||
| 037 | _cTextual | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aC21:(D), P7 | ||
| 100 | _aAlford Terry L | ||
| 245 | 0 |
_cby Alford Terry L; Feldman Leonard C; Mayer James W _aFundamentals of nanoscale film analysis |
|
| 260 |
_aNew York _bSpringer _c2007 |
||
| 300 |
_axiv,336p. _ccm. |
||
| 500 | _aIncludes bibliographical references; Appendix 1-13 291-329p; Index 330-336p | ||
| 650 | _a Nanostructured material | ||
| 650 | _a Thin film | ||
| 650 | _aPhysics | ||
| 700 | _a Feldman Leonard C | ||
| 700 | _a Mayer James W | ||
| 942 |
_hC21:(D), P7 _cTEXL _2CC |
||
| 999 |
_c25141 _d25141 |
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