000 00897nam a2200301Ia 4500
003 OSt
005 20220912150553.0
006 a|||||r|||| 00| 0
007 ta
008 220909b |||||||| |||| 00| 0 eng d
024 _a27333
037 _cTextual
040 _aCSL
_beng
_cCSL
041 _aeng
082 _aC53:35p1,N87, M8
100 _aSayre D Ed.
111 _aInternational symposium on x-ray microscopy II (Augu-Sept : NewYork)
245 0 _cSayre D Ed.; Howells M Ed.; Kirz J Ed.; Rarback H Ed.
_aProceeding on X-ray microscopy
260 _aBerlin
_bSpringer-Verlag
_c1988
300 _axiv, 454p.
_ccm.
490 _aSpringer Series in Optical Science s; 56
650 _aMicroscopy
700 _a Howells M Ed.
700 _a Kirz J Ed.
700 _a Rarback H Ed.
942 _hC53:35p1,N87, M8
_cTEXL
_2CC
999 _c50381
_d50381