| 000 | 00667nam a2200253Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912151337.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 024 | _a38292 | ||
| 037 | _cTextual | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aF191:E3, J3;L8 | ||
| 100 | _aSandell E B | ||
| 245 | 0 |
_cSandell E B; Onishi H _aPhotometric determination of traces of metals |
|
| 260 |
_aNew York _b John Wiley _c1978 |
||
| 300 |
_aix,1085p. _ccm. |
||
| 650 | _aTechnology | ||
| 700 | _a Onishi H | ||
| 942 |
_hF191:E3, J3;L8 _cTEXL _2CC |
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| 999 |
_c66475 _d66475 |
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