| 000 | 00852nam a2200265Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220928125915.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220927b |||||||| |||| 00| 0 eng d | ||
| 020 | _c6634.6809999999996 | ||
| 024 | _a115115 | ||
| 037 |
_b128, 10/02/2012, Aviva Books Company _cTextual |
||
| 040 |
_aSDCL _cSDCL _beng |
||
| 041 |
_2eng _aeng |
||
| 082 | _aD651, Q0 | ||
| 100 |
_aGarg Rajesh _9472245 |
||
| 245 | 0 |
_cGarg Rajesh; Khatri Sunil P _aAnalysis and design of resilient VLSI circuits _b Mitigating soft errors and process variations. |
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| 260 |
_aNew York _b Springer _c2010 |
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| 300 |
_axx,212p _ccm. |
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| 650 | _aElectronic Science | ||
| 700 |
_a Khatri Sunil P _9472246 |
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| 942 |
_hD651, Q0 _cTEXL _2CC |
||
| 999 |
_c784826 _d784826 |
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