Measurement techniques for radio frequency nanoelectronics Wallis T.Mitch; Kabos Pavel

By: Contributor(s): Material type: TextTextLanguage: English Series: The Cambridge RF and microwave engineering seriesPublication details: Delhi Cambridge University Press India 2017Description: xiv,314p. cmSubject(s): DDC classification:
  • D65,44, Q7
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Textual Textual South Campus Library South Campus Library D65,44 Q7 (Browse shelf(Opens below)) Available SC1621930

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