Delhi University Library System

Your cart is empty.

Cart
Lists
Public lists computer list of RTL hand books View all
Your lists Log in to create your own lists

Languages
English हिन्दी

Log in to your account
Your cookies
Search history

HOME
DULS LIBRARY TEAM
LIBRARY WEBSITE
DELHI UNIVERSITY PUBLISHING
REAL TIME DATA VISULIZATION DASHBOARD
LIST OF E-RESOURCES
E-NEWSPAPER
DOWNLOADS

Search the catalog by:

Search the catalog by keyword

Advanced search
Authority search
Tag cloud
Libraries

Log in to your account

Card number or username: Password:

Forgot your password?

Home
ISBD view for Surface Metrology for Micro- and Nanofabrication

Normal view MARC view ISBD view

Surface Metrology for Micro- and Nanofabrication

Gao, Wei

Surface Metrology for Micro- and Nanofabrication - Elsevier Elsevier 2020

ISBN: 9780128178508

Source: EBOOK

Surface Metrology for Micro- and Nanofabrication

APA

Gao W., . (2020). Surface Metrology for Micro- and Nanofabrication. Elsevier: Elsevier.

Chicago

Gao Wei, . 2020. Surface Metrology for Micro- and Nanofabrication. Elsevier: Elsevier.

Harvard

Gao W., . (2020). Surface Metrology for Micro- and Nanofabrication. Elsevier: Elsevier.

MLA

Gao Wei, . Surface Metrology for Micro- and Nanofabrication. Elsevier: Elsevier. 2020.

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Exporting to Dublin Core...

Simple DC-RDF

OAI-DC

SRW-DC

Copyright @ Delhi University Library System

Languages
English हिन्दी

Powered by Koha