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Pattern Recognition. ICPR International Workshops and Challenges

Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani

Pattern Recognition. ICPR International Workshops and Challenges - Springer Springer 2021

ISBN: 9783030687939

Source: EBOOK

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