Scanning electron microscopy and X-ray microanalysis
Goldstein Joseph I.
Scanning electron microscopy and X-ray microanalysis Goldstein Joseph I.; Newbury Dale E.; Echlin Patrick; Joy David C.; Lyman Charles E.; Lifshin Eric; Sawyer Linda; Michael Joseph R. - 3 - New York Kluwer Academic/Plenum Publishers 2003 - xix, 689p. cm. Includes with CD-ROM
Includes bibliographical references; Index 675-689p
0306472929 (hbd)
2191
Textbook
G:1996, P3 TH
Scanning electron microscopy and X-ray microanalysis Goldstein Joseph I.; Newbury Dale E.; Echlin Patrick; Joy David C.; Lyman Charles E.; Lifshin Eric; Sawyer Linda; Michael Joseph R. - 3 - New York Kluwer Academic/Plenum Publishers 2003 - xix, 689p. cm. Includes with CD-ROM
Includes bibliographical references; Index 675-689p
0306472929 (hbd)
2191
Textbook
G:1996, P3 TH