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Thin film and depth profile analysis

Oechsner H Ed.

Thin film and depth profile analysis Oechsner H Ed. - Berlin Springer-Verlag 1984 - xi,205p. cm. - Topics in current physics; 37 .

Standard No.: 27671

Source: Textual

Subjects--Topical Terms:
Plasma waves
Physics

Dewey Class. No.: C51:72, M4

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