Normal view MARC view ISBD view

Semiconductor devices measurements and tests

Grin G

Semiconductor devices measurements and tests Grin G - Moscow Mir Publishers 1980 - 207p. cm.

Standard No.: 48880

Source: Textual

Subjects--Topical Terms:
Semiconductor

Dewey Class. No.: C6:212, M0

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)