Modeling Simulation and Reliability Analysis of Doping less TFET for Radiation Sensitive and Low Power Circuit Applications (Record no. 1469674)

MARC details
000 -LEADER
fixed length control field 00705nam a2200205Ia 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20260114155021.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 008 250103s9999 xx 000 0 eng d
037 ## - SOURCE OF ACQUISITION
Stock number Theses
040 ## - CATALOGING SOURCE
Original cataloging agency CRL
Language of cataloging eng
Transcribing agency CRL
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
Source of code eng
084 ## - COLON CLASSIFICATION NUMBER
Assigning agency CRL
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Sharma Monika Au.
9 (RLIN) 869892
245 #0 - TITLE STATEMENT
Title Modeling Simulation and Reliability Analysis of Doping less TFET for Radiation Sensitive and Low Power Circuit Applications
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Delhi
Name of publisher, distributor, etc. University of Delhi. Faculty of Inter-Disciplinary&Applied Science. Deptt. of Elctronic Science
Date of publication, distribution, etc. 2023
300 ## - PHYSICAL DESCRIPTION
Extent 142p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electronic Science
9 (RLIN) 869893
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Gupta Mridula Gu.
9 (RLIN) 869894
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Thesis
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total Checkouts Barcode Date last seen Price effective from Koha item type
        Central Library Central Library 2026-01-14   TH0027617 2026-01-14 2026-01-14 Thesis