Physical principles of electron microscopy:an introduction to TEM,SEM, and AEM Egerton Ray F
Material type:
TextLanguage: English Publication details: New York Springer 2007Description: ix, 202p. cmISBN: - 9780387258000 (hbd)
- G:19, P7 Carpa
| Item type | Current library | Home library | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
Textbook
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Department of Physics and Astrophysics Library | Department of Physics and Astrophysics Library | G:19 P7 Carpa (Browse shelf(Opens below)) | Available | PA0006304 |
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Appendix 191-194p.; References 195-196p.; Index 197-202p.
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