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Electron microscopy and analysis Goodhew Peter J; Humphreys John; Beanland Richard

By: Contributor(s): Material type: TextTextLanguage: English Publication details: London Taylor & Francis 2001Edition: 3Description: xii,251p. illISBN:
  • 9780748409688 (pbk)
  • SL01560224
Subject(s): DDC classification:
  • E:(G:1996), P1-;4 TE
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Item type Current library Home library Call number Status Barcode
Textbook Textbook Central Science Library Central Science Library E:(G:1996) P1-;4 TE (Browse shelf(Opens below)) Available SL1560224

Include bibliographical references.; Index 243-251p.

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