Analysis and design of resilient VLSI circuits Garg Rajesh; Khatri Sunil P Mitigating soft errors and process variations.

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New York Springer 2010Description: xx,212p cmSubject(s): DDC classification:
  • D651, Q0
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Item type Current library Home library Call number Status Barcode
Textual Textual South Campus Library South Campus Library D651 Q0 (Browse shelf(Opens below)) Available SC1467482

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