VLSI test principles and architecture design for testability. Wang Laung-Terng Ed.; Wu Cheng-Wen Ed.

By: Contributor(s): Material type: TextTextLanguage: English Publication details: Amsterdam Morgan Kaufmann 2006Description: xxiii,777p cmSubject(s): DDC classification:
  • D651:81, P6
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Item type Current library Home library Call number Status Barcode
Textual Textual South Campus Library South Campus Library D651:81 P6 (Browse shelf(Opens below)) Available SC1303272

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