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1.
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Fundamentals of nanoscale film analysis by Alford Terry L; Feldman Leonard C; Mayer James W by
Material type: Text Text; Format: print regular print ; Literary form: Not fiction
Language: English
Publication details: New York Springer 2007
Availability: Items available for loan: Central Science Library (1)Collection, call number: C21:(D) P7.

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2.
Ion implantation in semiconductors: silicon and germanium Mayer James W; Eriksson L; Davies J A by
Material type: Text Text; Format: print regular print ; Literary form: Not fiction
Language: English
Publication details: New York Academic Press 1970
Availability: Items available for loan: Central Science Library (1)Collection, call number: D65,4,T L0.

Place hold Save to lists Add to cart